Total Sensitivity Based DFM Optimization of Standard Library
Total Sensitivity Based DFM Optimization of Standard Library Cells Yongchan Ban, Savithri Sundareswaran*, and David Z. Pan Dept. of ECE, The University of Texas at Austin, Austin, TX USA *Freescale Semiconductor, Austin, TX USA [email protected], [email protected], [email protected] ABSTRACT Standard cells are fundamental circuit building blocks designed at very